Method, apparatus, and program for detecting abnor

专利名称：Method, apparatus, and program for

detecting abnormal patterns

发明人：Nakamura, Keigo c/o Fuji Photo Film Co., Ltd.申请号：EP05011360.4申请日：20050525公开号：EP16002B1公开日：20130327

摘要：The positions of comparative tissue are more accurately set, in an abnormalpattern detecting apparatus that compares abnormal pattern candidates against healthytissue having similar tissue structures to judge whether the candidates are abnormalpatterns, to improve judgment accuracy. A comparative region image setting means (40)searches for images that are similar to images Q within candidate regions, which areextracted by a candidate region extracting means (10). The search is conducted

employing correlative values that represent the degrees of similarity among the imagesand the images within candidate regions. Similar images, which are located employing thecorrelative values, are set as comparative region images Q'.

申请人：FUJIFILM CORP

地址：JP

国籍：JP

代理机构：Klunker . Schmitt-Nilson . Hirsch

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