DEVICE TEST SYSTEM

申请(专利)号： JP20080231705

专利号： JP2010066081A 主分类号： G01D21/00 申请权利人： HITACHI KOKUSAI

ELECTRIC INC 公开国代码： JP 优先权国家： JP

摘 要：

PROBLEM TO BE SOLVED: To specify the causes of anomalies at an early stage by determining whether anomalies are caused by the failure of a device under test or due to other causes when anomalies exist in results of

tests.;SOLUTION: A device test system performs one test or more according to settings to one device under test or more to be tested and includes a test

information storage means for storing first test information for determining whether test results are normal or not and second test information for determining whether tests are valid or not for each test; a result determination means for determining

whether the test results are anomalous or not on the basis of the first stored test information; a cause determination means for determining the causes of anomalies of the test results on the basis of stored second test information when it is determined that the test results are anomalous; and a display means for displaying the test results and determination results by the result

申请日： 2008-09-10 公开公告日： 2010-03-25

分类号： G01D21/00;

G01R31/00 发明设计人： YOSHIDA

TERUHISA 申请国代码： JP

优先权： 20080910 JP

2008231705

摘 要 附 图：

determination means and further

displaying information based on results of cause determination according to the determination results by the cause determination means.;COPYRIGHT: (C)2010,JPO&INPIT 主权项：

試験対象となる１つ以上の被試験装置に対して、設定に従って、１つ以上の試験を行う装置試験システムであって、

前記試験の結果が正常であるか否かを判定するための第１の試験情報と、前記試験が有効であ

权 利 要 求 说 明 书

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说 明 书

【DEVICE TEST SYSTEM】的说明书内容是......请下载后查看